tem-image-analyzer

# TEM Image Analyzer ## Purpose The TEM Image Analyzer skill provides comprehensive analysis of transmission electron microscopy data for nanomaterial characterization, enabling automated particle detection, size distribution analysis, and crystallographic structure determination. ## Capabilities - Automated particle detection and sizing - Morphology classification - Lattice fringe analysis - Selected area electron diffraction (SAED) indexing - High-resolution TEM (HRTEM) analysis - STEM-HAADF imaging ## Usage Guidelines ### Image Analysis Workflow 1. **Particle Detection** - Apply appropriate thresholding - Use watershed for touching particles - Count minimum 200 particles for statistics 2. **Size Measurement** - Calibrate pixel size from scale bar - Measure Feret diameter or equivalent circular diameter - Report mean, standard deviation, distribution 3. **Crystallographic Analysis** - Index SAED patterns to phase - Measure d-spacings from lattice fringes - Identify zone axis from HRTEM ## Process Integration - Multi-Modal Nanomaterial Characterization Pipeline - Statistical Particle Size Distribution Analysis - In-Situ Characterization Experiment Design ## Input Schema ```json { "image_path": "string", "analysis_type": "sizing|morphology|crystallography", "scale_bar": {"length": "number", "pixels": "number"}, "expected_material": "string (for indexing)" } ``` ## Output Schema ```json { "particle_statistics": { "count":...